Value Proposition - Improved Quality
your Quality and Reliability resources with seasoned experts to drive
solutions to intractable issues, improve your test regime to prevent
returns, reduce or eliminate burn-in, fully analyze and report on root
cause of failures, qualify new products and technologies, and
characterize/audit your product's performance to spec or customer
requirements looking for areas with poor or nonexistant margin. We can
also solve yield issues that impact your outgoing quality, and separate
these from other yield issues that do not impact quality or
reliability. We know what your quality entitlement should be, and can benchmark your product families against this.
Our multi disciplinary team will evaluate
quality metrics against the technology and design
complexity entitlement of your product (and against your customer
needs), and find the best opportunities for improvement through
and data mining of your test and manufacturing information. If needed,
we will perform fault
localization and root cause failure analysis to determine and feed back
physical causes, along with recommendations to eliminate or improve
failures from these causes.
We have deep knowledge and
- Product characterization and corners analysis
- Design-for-test and design-for-manufacturability implementation
- Reliability physics and failure mechanisms
- Reliability testing, qualification, and standards
- Test and manufacturing data analysis and data mining
- Wafer fabrication modules and flows
- Fault localization
- Physical and electrical failure analysis
- Defect analysis and reduction
analog, mixed-signal, SoC, and embedded memory products on any silicon technology. Our experience also spans complex
packaging solutions including single, multi-chip, and 3D integration.
Specific STS quality improvement
STS helps you put quality first.